Efficient mode-matching analysis of discontinuities in finite planar substrates using perfectly matched layers

DOI10.1109/8.914270zbMath1034.78515OpenAlexW2153889684MaRDI QIDQ4448332

Daniël De Zutter, Frank Olyslager, Henk Derudder, Steve van Den Berghe

Publication date: 17 February 2004

Published in: IEEE Transactions on Antennas and Propagation (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/8.914270

zbMATH Keywords

scatteringsurface wavesfinite-difference time-domainmonolithic microwave integrated circuit

Mathematics Subject Classification ID

Related Items (1)

Perfectly matched layers in the thin layer method

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