A general model of heterogeneous system lifetimes and conditions for system burn-in

DOI10.1002/nav.10067zbMath1043.90017OpenAlexW2017346728MaRDI QIDQ4456072

Kyungmee O. Kim, Way Kuo

Publication date: 15 March 2004

Published in: Naval Research Logistics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1002/nav.10067

zbMATH Keywords

burn-inmixed distributiondecreasing failure rate (DFR)extrinsic failure rate (EXFR)IBM modelintrinsic failure rate (INFR)

Mathematics Subject Classification ID

Reliability, availability, maintenance, inspection in operations research (90B25)

Related Items (2)

Burn-in and covariates ⋮ Optimal burn-in for maximizing reliability of repairable non-series systems

Cites Work

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