Non-linear analog circuit fault diagnosis with large change sensitivity

DOI<link itemprop=identifier href="https://doi.org/10.1002/(SICI)1097-007X(200005/06)28:3<281::AID-CTA109>3.0.CO;2-N" /><281::AID-CTA109>3.0.CO;2-N 10.1002/(SICI)1097-007X(200005/06)28:3<281::AID-CTA109>3.0.CO;2-NzbMath1037.94564OpenAlexW1990117314MaRDI QIDQ4458668

Mike W. T. Wong, Matthew Worsman

Publication date: 15 March 2004

Full work available at URL: https://doi.org/10.1002/(sici)1097-007x(200005/06)28:3<281::aid-cta109>3.0.co;2-n

zbMATH Keywords

nonlinear analog circuitsfault dictionarylarge change sensitivity

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Related Items (1)

Improved analogue fault coverage estimation using probabilistic analysis

Cites Work

• An Algorithm for Solving Nonlinear Resistor Networks

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