Reconstruction of Thin Conductivity Imperfections
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Publication:4465267
DOI10.1080/00036810310001620090zbMath1047.35130OpenAlexW2070713998WikidataQ58190141 ScholiaQ58190141MaRDI QIDQ4465267
Elena Beretta, Elisa Francini, Habib Ammari
Publication date: 27 May 2004
Published in: Applicable Analysis (Search for Journal in Brave)
Full work available at URL: http://hdl.handle.net/2158/209160
Boundary value problems for second-order elliptic equations (35J25) Inverse problems for PDEs (35R30) Inverse problems (including inverse scattering) in optics and electromagnetic theory (78A46)
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Investigation of a non-iterative technique based on topological derivatives for fast localization of small conductivity inclusions ⋮ Asymptotic expansions and effective boundary conditions: a short review for smooth and nonsmooth geometries with thin layers ⋮ Uniform asymptotic expansion of the voltage potential in the presence of thin inhomogeneities with arbitrary conductivity ⋮ Reconstruction of thin conductivity imperfections, II. The case of multiple segments ⋮ Effective interface conditions for continuum mechanical models describing the invasion of multiple cell populations through thin membranes ⋮ The topological ligament in shape optimization: a connection with thin tubular inhomogeneities ⋮ An Asymptotic Representation Formula for Scattering by Thin Tubular Structures and an Application in Inverse Scattering ⋮ Derivation and Application of Effective Interface Conditions for Continuum Mechanical Models of Cell Invasion through Thin Membranes ⋮ Fast electromagnetic imaging of thin inclusions in half-space affected by random scatterers
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