Lower confidence bounds with sample size information for Cpm applied to production yield assurance

DOI10.1080/0020754031000138349zbMath1052.90542OpenAlexW2126004339MaRDI QIDQ4474692

Wen Lea Pearn, Ming-Hung Shu

Publication date: 12 July 2004

Published in: International Journal of Production Research (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/0020754031000138349

Mathematics Subject Classification ID

Production models (90B30)

Related Items (19)

Procedure of the convolution method for estimating production yield with sample size information ⋮ Supplier selection for one-sided processes with unequal sample sizes ⋮ Evaluating lifetime performance for the Pareto model with censored and imprecise information ⋮ Assessing process capability based on Bayesian approach with subsamples ⋮ Supplier Evaluation and Selection Based on Stochastic Dominance: A Quality-Based Approach ⋮ An asymptotic confidence interval for the process capability index C_pm ⋮ Optimal tool replacement for processes with low fraction defective ⋮ A Bayesian procedure for assessing process performance based on the third-generation capability index ⋮ Fuzzy inference to assess manufacturing process capability with imprecise data ⋮ An effective powerful test for one-sided supplier selection problem ⋮ Quality-yield measure for production processes with very low fraction defective ⋮ Testing process capability based onC_pmin the presence of random measurement errors ⋮ Generalized confidence intervals for the process capability index \(C_{pm}\) ⋮ A powerful test for two-sided multiple independent characteristics supplier selection problem ⋮ A flexible sampling scheme for variables inspection with loss consideration ⋮ Tool replacement for production with a low fraction of defectives ⋮ A comparison of methods forsing loss-based capability index ⋮ Process performance evaluation based on Taguchi capability index with the consideration of measurement errors ⋮ Design and Construction of a Variables Repetitive Group Sampling Plan for Unilateral Specification Limit

Cites Work

• The Distribution of Chi-Square
• Combining process capability indices from a sequence of independent samples

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