Scheduling of wafer test processes in semiconductor manufacturing

DOI10.1080/0020754031000118116zbMath1052.90583OpenAlexW2009585302MaRDI QIDQ4474714

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Publication date: 12 July 2004

Published in: International Journal of Production Research (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/0020754031000118116

Mathematics Subject Classification ID

Operations research and management science (90B99)

Related Items

Scheduling algorithms for a semiconductor probing facility, Semiconductor final test scheduling with Sarsa\((\lambda , k)\) algorithm, A new paradigm for rule-based scheduling in the wafer probe centre, Scheduling semiconductor multihead testers using metaheuristic techniques embedded with lot-specific and configuration-specific information, A survey of scheduling problems with setup times or costs

Cites Work

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• The Shifting Bottleneck Procedure for Job Shop Scheduling
• An interactive scheduler for a wafer probe centre in semiconductor manufacturing
• Rolling horizon procedures for dynamic parallel machine scheduling with sequence-dependent setup times
• The wafer probing scheduling problem (WPSP)