Use of contagious distributions in the semiconductor yield models considering cluster effect

DOI10.1080/03610920008832465zbMath0955.62121OpenAlexW2121194950MaRDI QIDQ4493672

Chi-Hyuck Jun, Kwang-Su Park

Publication date: 27 February 2001

Published in: Communications in Statistics - Theory and Methods (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/03610920008832465

zbMATH Keywords

Neyman distributionThomas distributionfatal probabilitysemiconductor yield models

Mathematics Subject Classification ID

Applications of statistics in engineering and industry; control charts (62P30) Reliability and life testing (62N05)

Uses Software

• Mathematica

Cites Work

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• A Generalized Class of Contagious Distributions
• On a general class of contagious distributions: The Pascal-Poisson distribution

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