Negative exponential disparity based family of goodness-of-fit tests for multinomial models

DOI10.1080/00949650008811989zbMath1121.62535OpenAlexW2092720102MaRDI QIDQ4493700

Dong-Bin Jeong, Sahadeb Sarkar

Publication date: 10 August 2000

Published in: Journal of Statistical Computation and Simulation (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/00949650008811989

Mathematics Subject Classification ID

Parametric hypothesis testing (62F03) Approximations to statistical distributions (nonasymptotic) (62E17) Asymptotic properties of parametric tests (62F05)

Related Items

Generalized weighted likelihood density estimators with application to finite mixture of exponential family distributions

Cites Work

• Unnamed Item
• Goodness-of-fit statistics for discrete multivariate data
• On disparity based goodness-of-fit tests for multinomial models
• Efficiency versus robustness: The case for minimum Hellinger distance and related methods
• Minimum negative exponential disparity estimation in parametric models
• Small-Sample Comparisons of Exact Levels for Chi-Squared Goodness-of-Fit Statistics
• An Empirical Investigation of Goodness-of-Fit Statistics for Sparse Multinomials
• A Comparison of the X 2 , -2 \Log R, and Multinomial Probability Criteria for Significance Tests when Expected Frequencies Are Small
• Small sample comparisons for the blended weight chi-square goodness-of-fit test statistics
• Asymptotically Optimal Tests for Multinomial Distributions
• Asymptotic normality and efficiency for certain goodness-of-fit tests
• A comparison of the chi²and likelihood ratio tests for composite alternatives1
• The $\chi^2$ Test of Goodness of Fit