Analysis of 1/f noise in switched MOSFET circuits
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Publication:4553190
DOI10.1109/82.917783zbMath1014.94562OpenAlexW2107504381MaRDI QIDQ4553190
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Publication date: 30 June 2003
Published in: IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1109/82.917783
\(1/f\) noisephase noisering oscillatorCMOS image sensornonstationary noise modelperiodically switched circuitstime-domain noise analysis
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