Complete Fault Detection Tests of Length 2 for Logic Networks under Stuck-at Faults of Gates
From MaRDI portal
Publication:4558289
DOI10.1134/S1990478918020102zbMath1424.94101OpenAlexW2806745257MaRDI QIDQ4558289
Publication date: 21 November 2018
Published in: Journal of Applied and Industrial Mathematics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1134/s1990478918020102
Related Items (2)
The length of a single fault detection test for constant-nonpreserving element insertions ⋮ Short Complete Fault Detection Tests for Logic Networks with Fan-In Two
Cites Work
- Unnamed Item
- Unnamed Item
- Unnamed Item
- Unnamed Item
- Unnamed Item
- Unnamed Item
- Testable design of AND-EXOR logic networks with universal test sets
- Lower estimate of the length of the complete test in the basis \(\{x|y \}\)
- Synthesis of easily-tested circuits in the case of single-type constant malfunctions at the element outputs
- Circuits admitting single-fault tests of length 1 under constant faults at outputs of elements
- Method of synthesis of easily testable circuits admitting single fault detection tests of constant length
- Synthesis of easily testable circuits over the Zhegalkin basis in the case of constant faults of type 0 at outputs of elements
- Dual-Mode Logic for Function-Independent Fault Testing
- On Minimally Testable Logic Networks
- LOWER BOUNDS FOR LENGTHS OF COMPLETE DIAGNOSTIC TESTS FOR CIRCUITS AND INPUTS OF CIRCUITS
- On the synthesis of circuits admitting complete fault detection test sets of constant length under arbitrary constant faults at the outputs of the gates
- On the exact value of the length of the minimal single diagnostic test for a particular class of circuits
This page was built for publication: Complete Fault Detection Tests of Length 2 for Logic Networks under Stuck-at Faults of Gates