Optimal Designs for LED Degradation Modeling

DOI10.1007/978-981-10-5194-4_8zbMath1402.62357OpenAlexW2753200922MaRDI QIDQ4559449

Hon Keung Tony Ng, Ding-Geng Chen, Tzong-Ru Tsai, Nan Jiang, Yuhlong Lio

Publication date: 3 December 2018

Published in: Statistical Modeling for Degradation Data (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/978-981-10-5194-4_8

zbMATH Keywords

Wiener processFisher informationinverse Gaussian distributiongamma processcumulative exposure modellifetime information

Mathematics Subject Classification ID

Applications of statistics in engineering and industry; control charts (62P30) Statistical aspects of information-theoretic topics (62B10) Reliability and life testing (62N05)

Uses Software

• SPLIDA

Cites Work

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• Properties of the Weibull cumulative exposure model
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• Optimum Simple Step-Stress Plans for Accelerated Life Testing
• Using Degradation Measures to Estimate a Time-to-Failure Distribution
• Optimal design of accelerated degradation tests based on Wiener process models