Estimation of Archival Lifetime Distribution for Writable Optical Disks from Accelerated Testings

DOI10.1007/978-0-8176-4971-5_24zbMath1407.62379OpenAlexW13605091MaRDI QIDQ4562211

Chiharu Kumazaki, Wataru Yamamoto, Kazuyuki Suzuki

Publication date: 18 December 2018

Published in: Mathematical and Statistical Models and Methods in Reliability (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/978-0-8176-4971-5_24

zbMATH Keywords

lognormal distributionEyring modelaccelerated lifetime testing

Mathematics Subject Classification ID

Applications of statistics in engineering and industry; control charts (62P30) Reliability and life testing (62N05)

Uses Software

• SPLIDA

Cites Work

• Accelerated Life Models
• Planning Accelerated Life Tests with Two or More Experimental Factors
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• Unnamed Item

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