A Free-Space Measurement Method for the Low-Loss Dielectric Characterization Without Prior Need for Sample Thickness Data
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Publication:4572153
DOI10.1109/TAP.2016.2587745zbMATH Open1391.78164OpenAlexW2467873472MaRDI QIDQ4572153
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Publication date: 18 July 2018
Published in: (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1109/tap.2016.2587745
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