Reliability Analysis of Large Circuits Using Scalable Techniques and Tools

DOI10.1109/TCSI.2007.907863zbMath1374.94961OpenAlexW2034449190WikidataQ57526803 ScholiaQ57526803MaRDI QIDQ4590265

Sandeep Kumar Shukla, Debayan Bhaduri, Paul Graham, Maya B. Gokhale

Publication date: 20 November 2017

Published in: IEEE Transactions on Circuits and Systems I: Regular Papers (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/tcsi.2007.907863

Mathematics Subject Classification ID

Hardware implementations of nonnumerical algorithms (VLSI algorithms, etc.) (68W35) Fault detection; testing in circuits and networks (94C12) Reliability, testing and fault tolerance of networks and computer systems (68M15)

Related Items (2)

Exact quantitative probabilistic model checking through rational search ⋮ Formal reliability analysis of combinational circuits using theorem proving

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