Optimum Design for Type-I Step-stress Accelerated Life Tests of Two-parameter Weibull Distributions

DOI10.1080/03610926.2012.707456zbMath1284.62628OpenAlexW1990477628MaRDI QIDQ4649607

Qiang Guan, Pei-Rong Xu, Hai-Yan Xu, Yin-cai Tang

Publication date: 12 November 2012

Published in: Communications in Statistics - Theory and Methods (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/03610926.2012.707456

zbMATH Keywords

maximum likelihood estimationtype-I censoringTFR model\(k\)-step step-stress accelerated life testWeibull distribution mathematics

Mathematics Subject Classification ID

Reliability and life testing (62N05)

Related Items (9)

Reliability model for dual constant-stress accelerated life test with Weibull distribution under Type-I censoring scheme ⋮ Statistical inference of Type-I progressively censored step-stress accelerated life test with dependent competing risks ⋮ Statistical inference for competing risks model in step-stress partially accelerated life tests with progressively type-I hybrid censored Weibull life data ⋮ Inferences in constant-partially accelerated life tests based on progressive type-II censoring ⋮ Estimating the Pareto parameters under progressive censoring data for constant-partially accelerated life tests ⋮ Estimation of the extended Weibull parameters and acceleration factors in the step-stress accelerated life tests under an adaptive progressively hybrid censoring data ⋮ Optimal designs for step-stress models under interval censoring ⋮ On estimation of modified Weibull parameters in presence of accelerated life test ⋮ Statistical inference of generalized progressive hybrid censored step-stress accelerated dependent competing risks model for Marshall-Olkin bivariate Weibull distribution

Cites Work

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• Optimum step-stress partially accelerated life tests for the truncated logistic distribution with censoring
• Conditions for the coincidence of the TFR, TRV and CE models
• A tampered failure rate model for step-stress accelerated life test
• Accelerated Life Testing - Step-Stress Models and Data Analyses
• Optimum simple ramp-tests for the Weibull distribution and type-I censoring

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