Goodness-of-Fit Tests for GEE Modeling with Binary Responses

DOI10.2307/3109778zbMath1058.62524OpenAlexW2066947937WikidataQ52241424 ScholiaQ52241424MaRDI QIDQ4666009

Huiman X. Barnhart, John M. Williamson

Publication date: 11 April 2005

Published in: Biometrics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.2307/3109778

zbMATH Keywords

score testlogistic regressiongoodness-of-fit testcorrelated dataGEE modeling

Mathematics Subject Classification ID

Nonparametric hypothesis testing (62G10) Asymptotic properties of nonparametric inference (62G20) Nonparametric robustness (62G35) Applications of statistics to biology and medical sciences; meta analysis (62P10)

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