Quality-yield measure for production processes with very low fraction defective

DOI10.1080/00207540410001699417zbMath1060.90608OpenAlexW2161272836MaRDI QIDQ4671352

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Publication date: 26 April 2005

Published in: International Journal of Production Research (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/00207540410001699417

Mathematics Subject Classification ID

Production models (90B30)

Related Items (3)

Developing a sampling plan by variables inspection for controlling lot fraction of defectives ⋮ Assessing process capability based on the lower confidence bound of \(C_{pk}\) for asymmetric tolerances ⋮ Measuring Process Performance Based on Expected Loss with Asymmetric Tolerances

Cites Work

• On the distributions of the estimated process capability indices
• How Reliable is Your Capability Index?
• Distribution and moments in simplified form for a general class of capability indices
• Lower confidence bounds with sample size information for C_pm applied to production yield assurance

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