A Survey of Methods Used to Control Piezoelectric Tube Scanners in High‐Speed AFM Imaging

DOI10.1002/ASJC.1728zbMath1397.93155OpenAlexW2792502737MaRDI QIDQ4683402

Hemanshu R. Pota, Ian R. Petersen, Md. Sohel Rana

Publication date: 21 September 2018

Published in: Asian Journal of Control (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1002/asjc.1728

zbMATH Keywords

nanotechnologyatomic force microscopelimiting factorspiezoelectric tube scanner

Mathematics Subject Classification ID

Feedback control (93B52) Application models in control theory (93C95)

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