Scheduling semiconductor multihead testers using metaheuristic techniques embedded with lot-specific and configuration-specific information

DOI10.1155/2013/436701zbMath1299.90148OpenAlexW2084894382WikidataQ59027548 ScholiaQ59027548MaRDI QIDQ473662

Gen-Han Wu, Chi-Chung Wang, Yi-Feng Hung

Publication date: 24 November 2014

Published in: Mathematical Problems in Engineering (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1155/2013/436701

Mathematics Subject Classification ID

Deterministic scheduling theory in operations research (90B35) Approximation methods and heuristics in mathematical programming (90C59)

Related Items (1)

Lot-order assignment applying priority rules for the single-machine total tardiness scheduling with nonnegative time-dependent processing times

Uses Software

• Tabu search

Cites Work

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• Optimization by Simulated Annealing
• Parallel machine scheduling to minimize the makespan with sequence dependent deteriorating effects
• Semiconductor final test scheduling with Sarsa\((\lambda , k)\) algorithm
• A hybrid genetic algorithm to minimize total tardiness for unrelated parallel machine scheduling with precedence constraints
• Particle swarm optimization algorithm for unrelated parallel machine scheduling with release dates
• Two meta-heuristics for parallel machine scheduling with job splitting to minimize total tardiness
• Tabu search for discrete-continuous scheduling problems with heuristic continuous resource allocation
• Unrelated parallel machine scheduling using local search
• A local search heuristic for unrelated parallel machine scheduling with efficient neighborhood search
• A comparative study of both standard and adaptive versions of threshold accepting and simulated annealing algorithms in three scheduling problems
• Genetic algorithms: Foundations and applications
• Parallel machine scheduling with additional resources: notation, classification, models and solution methods
• New complexity results for parallel identical machine scheduling problems with preemption, release dates and regular criteria
• A user's guide to tabu search
• Convergence of an annealing algorithm
• An Application of Bin-Packing to Multiprocessor Scheduling
• Scheduling of wafer test processes in semiconductor manufacturing
• Bounds on Multiprocessing Timing Anomalies

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