3D‐FDTD characterization of an original low‐loss silicon line

DOI10.1108/03321640210437879zbMath1015.78510OpenAlexW2025350878MaRDI QIDQ4780688

Odile Picon, Laurent Martoglio, Laurent Cirio, Alexandre Richardson

Publication date: 27 July 2003

Published in: COMPEL - The international journal for computation and mathematics in electrical and electronic engineering (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1108/03321640210437879

zbMATH Keywords

numerical analysismicrostrip transmission linestandart Silicon substrate

Mathematics Subject Classification ID

Finite element, Galerkin and related methods applied to problems in optics and electromagnetic theory (78M10) Technical applications of optics and electromagnetic theory (78A55)

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