ON A NEW SCALING FOR SEMICONDUCTOR DEVICE EQUATIONS AND ITS ASYMPTOTIC ANALYSIS

DOI10.1142/S0218202501001409zbMath1012.82029OpenAlexW2029010300MaRDI QIDQ4798918

J. P. Yvon, Bento Louro, Jacques Henry, Antoine Viel

Publication date: 16 March 2003

Published in: Mathematical Models and Methods in Applied Sciences (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1142/s0218202501001409

zbMATH Keywords

asymptotic analysisscalingsemiconductor devicesoxygen sensors

Mathematics Subject Classification ID

Statistical mechanics of semiconductors (82D37)

Cites Work

• A Singular Perturbation Analysis of Reverse-Biased Semiconductor Diodes
• Asymptotic Analysis of the Drift-Diffusion Equations and Hamilton–Jacobi Equations
• ASYMPTOTIC ESTIMATES FOR THE MULTI-DIMENSIONAL ELECTRO-DIFFUSION EQUATIONS

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