Bayesian burn-in procedures for limited failure populations

DOI10.1080/00207540210125470zbMath1064.90529OpenAlexW2123387903MaRDI QIDQ4807208

J. Bert Keats, Young Il Kwon

Publication date: 23 September 2003

Published in: International Journal of Production Research (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/00207540210125470

Mathematics Subject Classification ID

Applications of statistics in engineering and industry; control charts (62P30) Reliability, availability, maintenance, inspection in operations research (90B25) Production models (90B30)

Cites Work

• Unnamed Item
• Reliability Enhancement Through Optimal Burn-In
• Limited Failure Population Life Tests: Application to Integrated Circuit Reliability
• Estimating Population Size with Exponential Failure
• An economic sequential screening procedure for limited failure populations
• Warranty policies and burn-in
• A Sequential Screening Procedure

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