A general stability analysis of FIT/FDTD applied to lossy dielectrics and lumped elements
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Publication:4810518
DOI10.1002/jnm.547zbMath1054.78029OpenAlexW2008070434MaRDI QIDQ4810518
Fredrik Edelvik, Rolf Schuhmann, Thomas Weiland
Publication date: 16 August 2004
Published in: International Journal of Numerical Modelling: Electronic Networks, Devices and Fields (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1002/jnm.547
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