APPLYING QUANTUM SEARCH TO AUTOMATED TEST PATTERN GENERATION FOR VLSI CIRCUITS

DOI10.1142/S0219749903000097zbMath1074.81513OpenAlexW2084624889MaRDI QIDQ4819258

Amardeep Singh, Sarbjeet Singh

Publication date: 24 September 2004

Published in: International Journal of Quantum Information (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1142/s0219749903000097

zbMATH Keywords

neural networksimulated annealingquantum computerquantum search algorithmsATPGand VLSI

Mathematics Subject Classification ID

Quantum computation (81P68)

Related Items (1)

DNA computing approach for automated test pattern generation for digital circuits

Cites Work

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