Analysis of Stress-Driven Grain Boundary Diffusion. Part I
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Publication:4830611
DOI10.1137/S0036139903438235zbMath1060.35143OpenAlexW2147793598MaRDI QIDQ4830611
Jon Wilkening, Len Borucki, James A. Sethian
Publication date: 13 December 2004
Published in: SIAM Journal on Applied Mathematics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1137/s0036139903438235
junctionsstress tensorsemigroup theoryLamé equationsstress singularitiesinterface boundary conditionsDirichlet-to-Neumann mapelectromigrationmass transport in microelectronic circuits
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