Two-Stage Reliability Tests with Technological Evolution: A Bayesian Analysis

DOI10.2307/2986021zbMath0825.62718OpenAlexW13511545MaRDI QIDQ4844045

Karen D. S. Young, George A. Whitmore, Alan C. Kimber

Publication date: 17 August 1995

Published in: Applied Statistics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.2307/2986021

zbMATH Keywords

reliabilityBayesian analysisPoisson distributionfailuregamma distributiontechnologyinferenceengineering designdemonstration testsSiegel distribution

Mathematics Subject Classification ID

Bayesian inference (62F15) Reliability and life testing (62N05)

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