Sequential Screening in Semiconductor Manufacturing, I: Exploiting Spatial Dependence

DOI10.1287/OPRE.44.1.173zbMath0847.90071OpenAlexW2093784612MaRDI QIDQ4883212

Lawrence M. Wein, Mark D. Longtin, Roy E. Welsch

Publication date: 13 October 1996

Published in: Operations Research (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1287/opre.44.1.173

zbMATH Keywords

semiconductor manufacturingMarkov random field modelbad chipschip locationsimultaneous quality and quantity control

Mathematics Subject Classification ID

Applications of statistics in engineering and industry; control charts (62P30) Production models (90B30) Inventory, storage, reservoirs (90B05)

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A review of yield modelling techniques for semiconductor manufacturing

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