PERFORMANCE EVALUATION OF SOURCE HETEROJUNCTION STRAINED CHANNEL GATE ALL AROUND NANOWIRE TRANSISTOR
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Publication:4911462
DOI10.1142/S0217984912500765zbMath1263.82063OpenAlexW2138699979MaRDI QIDQ4911462
Morteza Fathipour, Rahim Faez, Reza Hosseini
Publication date: 15 March 2013
Published in: Modern Physics Letters B (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1142/s0217984912500765
Statistical mechanics of semiconductors (82D37) Transport processes in time-dependent statistical mechanics (82C70) Quantum waveguides, quantum wires (82D77)
Cites Work
- Boundary treatments in non-equilibrium Green's function (NEGF) methods for quantum transport in nano-MOSFETs
- Modeling, verification and comparison of short-channel double gate and gate-all-around MOSFETs
- NUMERICAL INVESTIGATION ON THE TEMPERATURE DEPENDENCE OF THE CYLINDRICAL-GATE-ALL-AROUND Si-NW-FET
- Quantum Transport: Atom to Transistor
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