Support vector machines for measuring dielectric properties of materials

DOI10.1108/03321641011044497zbMath1197.78026OpenAlexW2121155889MaRDI QIDQ4933003

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Publication date: 7 October 2010

Published in: COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1108/03321641011044497

zbMATH Keywords

iterative methodsfinite element analysismicrowavesdielectric propertiesmaterials management

Mathematics Subject Classification ID

Learning and adaptive systems in artificial intelligence (68T05) Finite element, Galerkin and related methods applied to problems in optics and electromagnetic theory (78M10) Waves and radiation in optics and electromagnetic theory (78A40) Numerical methods for inverse problems for boundary value problems involving PDEs (65N21)

Cites Work

• Practical selection of SVM parameters and noise estimation for SVM regression

Related Items (1)

Computational Science and Its Applications – ICCSA 2004

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