A one-sided test for testino homogeneity of scale parameters against simple ordered alternative

DOI10.1080/03610929908832428zbMath1072.62526OpenAlexW2089381059MaRDI QIDQ4935414

Anil Kumar Dhawan, Amar Nath Gill

Publication date: 1999

Published in: Communications in Statistics - Theory and Methods (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/03610929908832428

Mathematics Subject Classification ID

Parametric hypothesis testing (62F03) Parametric inference under constraints (62F30)

Related Items

A One Sided Test Based on Sample Quasi Ranges ⋮ A nonparametric test for a multi-sample scale problem using ranked-set data ⋮ A closed testing procedure for comparison between successive variances ⋮ A Note on Testing Homogeneity of Several Exponential Location Parameters ⋮ A note on successive comparisons between several ordered variances ⋮ Distribution of ratio of extreme of isotonic estimators of chi-square variables with applications ⋮ A Bayesian multiple comparison procedure for simply ordered treatment medians ⋮ Step-up multiple comparison procedure for comparing several normal variances ⋮ New nonparametric tests for testing homogeneity of scale parameters against umbrella alternative ⋮ A class of nonparametric tests for testing homogeneity of variances against ordered alternatives based on subsample extrema ⋮ On Tests Based on Sample Quasi Ranges for Ordered Alternative (Scale Case of Exponential Distribution) ⋮ A test against an umbrella ordered alternative ⋮ Testing Homogeneity of Gini Indices Against Simple-Ordered Alternative ⋮ Simultaneous Testing for the Successive Differences of Exponential Location Parameters ⋮ Simultaneous confidence intervals for the successive ratios of scale parameters

Cites Work

• On a modified test of equality of scale parameters of exponential distributions
• A One-Sided Studentized Range Test for Testing Against a Simple Ordered Alternative
• A new class of distribution free procedures for testing homogeneity of scale parameters against ordered alternatives
• Simultaneous one-sided confidence intervals for the ordered pairwise differences of exponential location parameters
• Properties of sufficiency and statistical tests

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