Flexible reliability assessment of digital circuits based on signal probability
From MaRDI portal
Publication:4960702
DOI10.1080/00949655.2018.1473399OpenAlexW2803764540MaRDI QIDQ4960702
Tian Ban, Yuehua Li, Xingjian Xu
Publication date: 23 April 2020
Published in: Journal of Statistical Computation and Simulation (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1080/00949655.2018.1473399
Cites Work
This page was built for publication: Flexible reliability assessment of digital circuits based on signal probability