Analysis of simple step-stress accelerated life test data from Lindley distribution under type-I censoring
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Publication:4965758
DOI10.6092/issn.1973-2201/6243zbMath1454.62300OpenAlexW2582919059MaRDI QIDQ4965758
V. S. Vaidyanathan, Varghese A. Sharon
Publication date: 10 March 2021
Full work available at URL: https://doaj.org/article/e9736c5472d04d25835220fd57c84e01
Parametric tolerance and confidence regions (62F25) Point estimation (62F10) Reliability and life testing (62N05)
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Cites Work
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- Lindley distribution and its application
- On the Lambert \(w\) function
- Asymptotic Comparison Between Constant-stress Testing and Step-stress Testing for Type-I Censored Data from Exponential Distribution
- Optimum simple step-stress accelerated life tests with censoring
- Optimum Simple Step-Stress Plans for Accelerated Life Testing
- Accelerated Life Testing - Step-Stress Models and Data Analyses
- Optimum simple step-stress accelerated life-tests with competing causes of failure
- Accelerated Testing
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