Analytical validation of the Young–Dupré law for epitaxially-strained thin films
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Publication:4973274
DOI10.1142/S0218202519500441zbMath1427.74115arXiv1809.09991OpenAlexW2972587745WikidataQ114847103 ScholiaQ114847103MaRDI QIDQ4973274
Publication date: 3 December 2019
Published in: Mathematical Models and Methods in Applied Sciences (Search for Journal in Brave)
Full work available at URL: https://arxiv.org/abs/1809.09991
Stability in context of PDEs (35B35) Thin films (74K35) Existence theories for free problems in two or more independent variables (49J10) Variational methods for elliptic systems (35J50) PDEs in connection with mechanics of deformable solids (35Q74)
Related Items (10)
Microscopical justification of solid-state wetting and dewetting ⋮ Derivation of a heteroepitaxial thin-film model ⋮ Equilibrium configurations for epitaxially strained films and material voids in three-dimensional linear elasticity ⋮ The surface diffusion flow with elasticity in three dimensions ⋮ Microscopical justification of the Winterbottom problem for well-separated lattices ⋮ A regularized model for wetting/dewetting problems: positivity and asymptotic analysis ⋮ Microscopic Validation of a Variational Model of Epitaxially Strained Crystalline Films ⋮ Surface evolution of elastically stressed films ⋮ A unified model for stress-driven rearrangement instabilities ⋮ Area quasi-minimizing partitions with a graphical constraint: relaxation and two-dimensional partial regularity
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