Randomized polynomial time identity testing for noncommutative circuits
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Publication:4978027
DOI10.1145/3055399.3055442zbMath1369.68347arXiv1606.00596OpenAlexW2963334575MaRDI QIDQ4978027
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Publication date: 17 August 2017
Published in: Proceedings of the 49th Annual ACM SIGACT Symposium on Theory of Computing (Search for Journal in Brave)
Full work available at URL: https://arxiv.org/abs/1606.00596
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