OPTIMAL DESIGN OF SIMPLE STEP-STRESS ACCELERATED LIFE TESTS FOR ONE-SHOT DEVICES UNDER EXPONENTIAL DISTRIBUTIONS

DOI10.1017/S0269964818000049OpenAlexW2793823306WikidataQ115562926 ScholiaQ115562926MaRDI QIDQ5056606

Man Ho Ling

Publication date: 8 December 2022

Published in: Probability in the Engineering and Informational Sciences (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1017/s0269964818000049

zbMATH Keywords

exponential distributionEM algorithmoptimal designcumulative exposure modelone-shot devicesstep-stress accelerated life-tests

Mathematics Subject Classification ID

Statistics (62-XX) Operations research, mathematical programming (90-XX)

Related Items (2)

A Bayesian Approach for Step-Stress-Accelerated Life Tests for One-Shot Devices Under Exponential Distributions ⋮ Robust estimation based on one-shot device test data under log-normal lifetimes

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