Parametric inference of the process capability index for exponentiated exponential distribution

DOI10.1080/02664763.2021.1971632OpenAlexW3198157392WikidataQ115551548 ScholiaQ115551548MaRDI QIDQ5056936

Sanku Dey, Mahendra Saha, Saralees Nadarajah

Publication date: 8 December 2022

Published in: Journal of Applied Statistics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/02664763.2021.1971632

zbMATH Keywords

Monte Carlo simulationgeneralized Rayleigh distributionexponentiated exponential distributionbootstrap confidence intervalprocess capability indexclassical methods of estimation

Mathematics Subject Classification ID

Applications of statistics (62Pxx)

Cites Work

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• Variable sampling inspection for resubmitted lots based on process capability index \(C_{pk}\) for normally distributed items
• Variables sampling inspection scheme for resubmitted lots based on the process capability index \(C_{pk}\)
• Kumaraswamy distribution: different methods of estimation
• Bootstrap methods for standard errors, confidence intervals, and other measures of statistical accuracy
• Estimation of selected parameters
• Capability indices for Birnbaum–Saunders processes applied to electronic and food industries
• Exponentiated Chen distribution: Properties and estimation
• Generalized exponential distributions
• Bootstrap confidence intervals of generalized process capability indexC_pykfor Lindley and power Lindley distributions
• Bootstrap confidence intervals of generalized process capability indexC_pykusing different methods of estimation
• Statistical inference for the lifetime performance index of products with Pareto distribution on basis of general progressive type II censored sample
• Improved bootstrap confidence intervals for the process capability indexC_pk
• Bootstrap confidence intervals of process capability indexS_pmkusing different methods of estimation
• Determination of multiple dependent state repetitive group sampling plan based on the process capability index
• Weighted exponential distribution: properties and different methods of estimation
• Bootstrap confidence intervals of C_Npkfor inverse Rayleigh and log-logistic distributions

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