A Bernstein–von-Mises theorem for the Calderón problem with piecewise constant conductivities
From MaRDI portal
Publication:5060696
DOI10.1088/1361-6420/ac9db8OpenAlexW4307449661WikidataQ115040490 ScholiaQ115040490MaRDI QIDQ5060696
Publication date: 11 January 2023
Published in: Inverse Problems (Search for Journal in Brave)
Full work available at URL: https://arxiv.org/abs/2206.08177
Boundary value problems for second-order elliptic equations (35J25) Inverse problems for PDEs (35R30)
Cites Work
- Unnamed Item
- The Bayesian formulation of EIT: analysis and algorithms
- A global uniqueness theorem for an inverse boundary value problem
- Efficient nonparametric Bayesian inference for \(X\)-ray transforms
- On statistical Calderón problems
- Bernstein-von Mises theorems for statistical inverse problems. I: Schrödinger equation
- Localized potentials in electrical impedance tomography
- Reconstructions from boundary measurements
- Global uniqueness for a two-dimensional inverse boundary value problem
- Infinite-dimensional inverse problems with finite measurements
- Statistical guarantees for Bayesian uncertainty quantification in nonlinear inverse problems with Gaussian process priors
- Regularized D-bar method for the inverse conductivity problem
- 30 years of Calderón's problem
- A remark on Lipschitz stability for inverse problems
- A remark on a paper by Alessandrini and Vessella
- Calderón's inverse conductivity problem in the plane
- Lipschitz stability for the inverse conductivity problem
- Posterior consistency and convergence rates for Bayesian inversion with hypoelliptic operators
- Inverse problems: A Bayesian perspective
- Newton regularizations for impedance tomography: convergence by local injectivity
- Electrical impedance tomography and Calderón's problem
- Determining conductivity by boundary measurements II. Interior results
- Asymptotic Statistics
- Uniqueness and Lipschitz stability in electrical impedance tomography with finitely many electrodes
- Bernstein--von Mises Theorems and Uncertainty Quantification for Linear Inverse Problems
- Convergence Rates for Penalized Least Squares Estimators in PDE Constrained Regression Problems
- Consistent Inversion of Noisy <scp>Non‐Abelian X‐Ray</scp> Transforms
- Consistency of Bayesian inference with Gaussian process priors in an elliptic inverse problem
- D‐Bar Method for Electrical Impedance Tomography with Discontinuous Conductivities
