Quantification of model bias underlying the phenomenon of Einstein from Noise

DOI10.5705/ss.202020.0334OpenAlexW3094257659MaRDI QIDQ5072153

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Publication date: 25 April 2022

Published in: Statistica Sinica (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.5705/ss.202020.0334

zbMATH Keywords

extreme value distributioncross correlationhigh dimensional data analysiscryogenic electron microscopymodel biaswhite-noise image

Mathematics Subject Classification ID

Statistics (62-XX)

Related Items (1)

Uncertainty Quantification in Dynamic Image Reconstruction with Applications to Cryo-EM

Cites Work

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• The asymptotic expansion of a ratio of gamma functions
• Distributions of Angles in Random Packing on Spheres
• Variance Estimation Using Refitted Cross-Validation in Ultrahigh Dimensional Regression

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