Copula models for one-shot device testing data with correlated failure modes

DOI10.1080/03610926.2020.1725827OpenAlexW3004915616MaRDI QIDQ5078871

No author found.

Publication date: 25 May 2022

Published in: Communications in Statistics - Theory and Methods (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/03610926.2020.1725827

zbMATH Keywords

Frank copulaGumbel-Hougaard copulaconstant-stress accelerated lifetests one-shot devices

Mathematics Subject Classification ID

Statistics (62-XX)

Related Items (1)

Reliability of a two‐dimensional demand‐based networked system with multistate components

Cites Work

• Unnamed Item
• Unnamed Item
• Bayesian copula selection
• Reliability Research of Dependent Failure Systems Using Copula
• Les tableaux de corrélation et les programmes linéaires
• The Bayesian approach for highly reliable electro-explosive devices using one-shot device testing
• Testing Disease Dependence in Survival Experiments with Serial Sacrifice
• Bivariate degradation analysis of products based on Wiener processes and copulas
• Dependence Between Two Diagnostic Tests with Copula Function Approach: A Simulation Study
• Advances in reliability

This page was built for publication: Copula models for one-shot device testing data with correlated failure modes