Degradation modeling based on gamma process models with random effects
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Publication:5084959
DOI10.1080/03610918.2017.1324981OpenAlexW2614102503MaRDI QIDQ5084959
Anna Patricia Rodríguez-Picón, Manuel I. Rodríguez-Borbón, Luis Carlos Méndez-González, Luis Alberto Rodríguez-Picón, Alejandro Alvarado-Iniesta
Publication date: 29 June 2022
Published in: Communications in Statistics - Simulation and Computation (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1080/03610918.2017.1324981
Processes with independent increments; Lévy processes (60G51) Bayesian inference (62F15) Reliability and life testing (62N05)
Related Items (5)
Nonparametric optimal designs for degradation tests ⋮ Condition-based maintenance for a system subject to multiple degradation processes with stochastic arrival intensity ⋮ Reliability modelling considering multi-dimensional cognitive uncertainties based on uncertainty theory ⋮ CUSUM control schemes for monitoring Wiener processes ⋮ Degradation data analysis based on gamma process with random effects
Uses Software
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