On the Reliability of FeFET On-Chip Memory
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Publication:5095025
DOI10.1109/TC.2021.3066899OpenAlexW3137500779MaRDI QIDQ5095025
Paul R. Genssler, Hussam Amrouch, Jörg Henkel, Victor M. van Santen
Publication date: 5 August 2022
Published in: IEEE Transactions on Computers (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1109/tc.2021.3066899
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