STATISTICAL ANALYSIS OF SERIES SYSTEM FOR MASKED DATA UNDER SUCCESSIVE CENSORED LIFE TEST
From MaRDI portal
Publication:5121360
DOI10.11948/2016049zbMath1463.62314OpenAlexW2368359670MaRDI QIDQ5121360
Xiaoling Xu, Lei Luo, Rong-Hua Wang, Beiqing Gu
Publication date: 14 September 2020
Published in: Journal of Applied Analysis & Computation (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.11948/2016049
Cites Work
- Unnamed Item
- Unnamed Item
- Bayes estimators for reliability measures in geometric distribution model using masked system life test data
- Estimation of components reliability in a parallel system using masked system life data
- Parameter estimations in linear failure rate model using masked data.
- Parameter estimations in a general hazard rate model using masked data
- Bayesian estimation of the parameters in two non-independent component series system with dependent time failure rate
- Estimation of system components reliabilities using masked data
- Statistical inference of Weibull distribution for tampered failure rate model in progressive stress accelerated life testing
- Interval estimation from censored and masked system-failure data
- Maximum likelihood analysis of component reliability using masked system life-test data
- Exact maximum likelihood estimation using masked system data
- Uniqueness of the Maximum Likelihood Estimate of the Weibull Distribution Tampered Failure Rate Model
- Bayesian Inference for Masked System Lifetime Data
This page was built for publication: STATISTICAL ANALYSIS OF SERIES SYSTEM FOR MASKED DATA UNDER SUCCESSIVE CENSORED LIFE TEST