The Youden Index and the Optimal Cut-Point Corrected for Measurement Error
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Publication:5122670
DOI10.1002/bimj.200410133zbMath1442.62569OpenAlexW2134268004WikidataQ44596072 ScholiaQ44596072MaRDI QIDQ5122670
Neil J. Perkins, Enrique F. Schisterman
Publication date: 23 September 2020
Published in: Biometrical Journal (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1002/bimj.200410133
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