The Local Geometry of Testing in Ellipses: Tight Control via Localized Kolmogorov Widths
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Publication:5124490
DOI10.1109/TIT.2020.2981313zbMath1446.62126arXiv1712.00711OpenAlexW3012549477MaRDI QIDQ5124490
Martin J. Wainwright, Yuting Wei
Publication date: 29 September 2020
Published in: IEEE Transactions on Information Theory (Search for Journal in Brave)
Full work available at URL: https://arxiv.org/abs/1712.00711
Related Items (4)
Unnamed Item ⋮ From Gauss to Kolmogorov: localized measures of complexity for ellipses ⋮ Nonparametric distributed learning under general designs ⋮ Optimal detection of the feature matching map in presence of noise and outliers
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