Information Assurance Through Redundant Design: A Novel TNU Error-Resilient Latch for Harsh Radiation Environment

DOI10.1109/TC.2020.2966200OpenAlexW3000209635MaRDI QIDQ5125941

Xiaoqing Wen, Jie Cui, Tianming Ni, Aibin Yan, Yuanjie Hu, Zhili Chen, Zhengfeng Huang, Patrick R. Girard

Publication date: 2 October 2020

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/tc.2020.2966200

Mathematics Subject Classification ID

Computer science (68-XX)

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