BayesianD-optimal Accelerated Life Test plans for series systems with competing exponential causes of failure

DOI10.1080/02664763.2015.1106449OpenAlexW2333994193MaRDI QIDQ5138096

Soumya Roy, Chiranjit Mukhopadhyay

Publication date: 3 December 2020

Published in: Journal of Applied Statistics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/02664763.2015.1106449

zbMATH Keywords

sensitivity analysisconstrained optimizationFisher informationprior informationgeneral equivalence theorem

Mathematics Subject Classification ID

Optimal statistical designs (62K05) Reliability and life testing (62N05)

Related Items (2)

Inference for log‐location‐scale family of distributions under competing risks with progressive type‐I interval censored data ⋮ Bayesian accelerated life test plans for series systems with Weibull component lifetimes

Uses Software

• SPLIDA

Cites Work

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• On Bayesian \(D\)-optimal design criteria and the general equivalence theorem in joint generalized linear models for the mean and dispersion
• Bayesian accelerated life testing under competing log-location-scale family of causes of failure
• Optimal Bayesian design applied to logistic regression experiments
• Bayesian design for accelerated life testing
• Simulation-based designs for accelerated life tests
• Bayesian experimental design: A review
• Accelerated life test planning with independent lognormal competing risks
• Optimal Accelerated Life Designs for Estimation
• Accelerated life tests under competing weibull causes of failure
• Accelerated Testing
• Locally Optimal Designs for Estimating Parameters

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