Failure probability estimation under additional subsystem information with application to semiconductor burn-in

DOI10.1080/02664763.2016.1189522OpenAlexW2395678455MaRDI QIDQ5138591

Jürgen Pilz, Horst Lewitschnig, Daniel Kurz

Publication date: 4 December 2020

Published in: Journal of Applied Statistics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/02664763.2016.1189522

zbMATH Keywords

Bayesburn-inbinomial distributionClopper-Pearsonserial system reliability

Mathematics Subject Classification ID

Statistics (62-XX)

Uses Software

• GenBinomApps

Cites Work

• Bayesian reliability
• Interval estimation for a binomial proportion. (With comments and a rejoinder).
• Confidence intervals for a binomial proportion and asymptotic expansions
• New Results for Computing Blaker’s Exact Confidence Interval for One Parameter Discrete Distributions
• Confidence Intervals for the Product of Two Binomial Parameters
• Decision Theory
• Lower Confidence Limits for Series System Reliability from Binomial Subsystem Data
• On Optimality Properties of the Power Prior
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