LOWER BOUNDS FOR LENGTHS OF COMPLETE DIAGNOSTIC TESTS FOR CIRCUITS AND INPUTS OF CIRCUITS
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Publication:5150757
DOI10.17223/20710410/34/5zbMath1492.94229OpenAlexW2566939818MaRDI QIDQ5150757
Publication date: 15 February 2021
Published in: Prikladnaya diskretnaya matematika (Search for Journal in Brave)
Full work available at URL: http://mathnet.ru/eng/pdm564
Fault detection; testing in circuits and networks (94C12) Reliability, testing and fault tolerance of networks and computer systems (68M15) Boolean functions (94D10)
Related Items (12)
Tests with stuck-at and shift faults on circuit inputs ⋮ Complete Fault Detection Tests of Length 2 for Logic Networks under Stuck-at Faults of Gates ⋮ Short complete diagnostic tests for circuits with one additional input in the standard basis ⋮ Short complete diagnostic tests for circuits with two additional inputs in some basis ⋮ On test sets concerning local stuck-at faults of fixed multiplicity at the inputs of circuits ⋮ Short complete diagnostic tests for logic circuits in one infinite basis ⋮ Short complete diagnostic tests for circuits implementing linear Boolean functions ⋮ Lower bounds for the lengths of single tests for Boolean circuits ⋮ A method of synthesis of irredundant circuits admitting single fault detection tests of constant length ⋮ Tests concerning certain types of faults at the scheme inputs ⋮ Short single tests for circuits with arbitrary stuck-at faults at outputs of gates ⋮ Lower bound of the length of a single fault diagnostic test with respect to insertions of a mod-2 adder
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