Planning step-stress test plans under Type-I censoring for the log-location-scale case

DOI10.1080/00949655.2012.672573zbMath1453.62691OpenAlexW2004211781MaRDI QIDQ5218920

Cheng-Chieh Chou, Chien-Tai Lin, Narayanaswamy Balakrishnan

Publication date: 6 March 2020

Published in: Journal of Statistical Computation and Simulation (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/00949655.2012.672573

zbMATH Keywords

optimizationreliabilitymaximum likelihoodcensored datadistributed computationsaccelerated lifeWeibull and similar distributions

Mathematics Subject Classification ID

Computational methods for problems pertaining to statistics (62-08) Reliability and life testing (62N05)

Related Items (4)

Planning step-stress test plans under type-I hybrid censoring for the log-location-scale distribution ⋮ Planning step-stress test under Type-I censoring for the exponential case ⋮ Designing Bayesian sampling plans for simple step-stress of accelerated life test on censored data ⋮ Optimal designs for step-stress models under interval censoring

Cites Work

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• Minimizing multimodal functions of continuous variables with the “simulated annealing” algorithm—Corrigenda for this article is available here
• Accelerated Testing
• Optimum M-step, step-stress design with K stress variables
• Planning step‐stress life test with progressively type I group‐censored exponential data
• Optimum step‐stress accelerated life test plans for log‐location‐scale distributions
• Advances in reliability

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