Robust Estimators and Test Statistics for One-Shot Device Testing Under the Exponential Distribution

DOI10.1109/TIT.2019.2903244zbMath1432.62064arXiv1704.07865OpenAlexW2962815495WikidataQ115534494 ScholiaQ115534494MaRDI QIDQ5223987

Nirian Martín, Elena Castilla, Narayanaswamy Balakrishnan, Leandro Pardo

Publication date: 19 July 2019

Published in: IEEE Transactions on Information Theory (Search for Journal in Brave)

Full work available at URL: https://arxiv.org/abs/1704.07865

Mathematics Subject Classification ID

Asymptotic properties of parametric estimators (62F12) Parametric hypothesis testing (62F03) Point estimation (62F10) Robustness and adaptive procedures (parametric inference) (62F35) Reliability and life testing (62N05)

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